AN ANALYTICAL EXPRESSION FOR THE CALCULATION OF ELECTRON MEAN FREE PATHS IN SOLIDSSZAJMAN J; LECKEY RCG.1981; J. ELECTRON SPECTROSC. RELAT. PHENOM.; ISSN 0368-2048; NLD; DA. 1981; VOL. 23; NO 1; PP. 83-96; BIBL. 49 REF.Article

ELECTRON MEAN FREE PATH IN CDTE: 350-1450 EVSZAJMAN J; LECKEY RCG; LIESEGANG J et al.1980; J. ELECTRON SPECTROSC. RELAT. PHENOM.; ISSN 0368-2048; NLD; DA. 1980; VOL. 20; NO 4; PP. 323-326; BIBL. 11 REF.Article

IS THERE A UNIVERSAL MEAN-FREE-PATH CURVE FOR ELECTRON INELASTIC SCATTERING IN SOLIDSSZAJMAN J; LIESEGANG J; JENKIN JG et al.1981; J. ELECTRON SPECTROSC. RELAT. PHENOM.; ISSN 0368-2048; NLD; DA. 1981; VOL. 23; NO 1; PP. 97-102; BIBL. 11 REF.Article

PHOTOELECTRON DETERMINATION OF MEAN FREE PATHS OF 200-1500 EV ELECTRONS IN POTASSIUM IODIDESZAJMAN J; LIESEGANG J; LECKEY RCG et al.1978; PHYS. REV., B; USA; DA. 1978; VOL. 18; NO 8; PP. 4010-4014; BIBL. 22 REF.Article

ELECTRONIC STRUCTURE OF THE ALKALINE-EARTH FLUORIDES STUDIED BY PHOTOELECTRON SPECTROSCOPY.POOLE RT; SZAJMAN J; LECKEY RCG et al.1975; PHYS. REV., B; U.S.A.; DA. 1975; VOL. 12; NO 12; PP. 5872-5877; BIBL. 19 REF.Article

ELECTRON MEAN FREE PATHS IN GE IN THE RANGE 70-140 EV.SZAJMAN J; JENKIN JG; LIESEGANG J et al.1978; J. ELECTRON SPECTROSC. RELAT. PHENOMENA; NLD; DA. 1978; VOL. 14; NO 1; PP. 41-48; BIBL. 26 REF.Article

SUBSHELL PHOTOIONIZATION CROSS-SECTIONS, ELECTRON MEAN FREE PATHS AND QUANTITATIVE X-RAY PHOTOELECTRON SPECTROSCOPYSZAJMAN J; JENKIN JG; LECKEY RCG et al.1980; J. ELECTRON SPECTROSC. RELAT. PHENOMENA; NLD; DA. 1980; VOL. 19; NO 4; PP. 393-408; BIBL. 25 REF.Article

Mie scattering in the first-order corrected eikonal approximationDI MARZIO, F; SZAJMAN, J.Computer physics communications. 1992, Vol 70, Num 2, pp 297-304, issn 0010-4655Article

On the semi-empirical elemental sensitivity factors for AES: ionization cross-section and electron mean free path = Sur les facteurs de sensibilité semi-empiriques à l'élément: la section efficace d'ionisation et le libre parcours moyen de l'électronPAYLING, R; SZAJMAN, J.Journal of electron spectroscopy and related phenomena. 1987, Vol 43, Num 1, pp 37-51, issn 0368-2048Article

A novel technique for the measurement of stress in thin metallic filmsASKRABA, S; CUSSEN, L. D; SZAJMAN, J et al.Measurement science & technology (Print). 1996, Vol 7, Num 6, pp 939-943, issn 0957-0233Article

An extrinsic optical fibre speed sensor based on cross correlationGOGOASA, I; MURPHY, M; SZAJMAN, J et al.Measurement science & technology (Print). 1996, Vol 7, Num 8, pp 1148-1152, issn 0957-0233Article

X-ray photoelectron spectroscopy studies of valence states of cerium and uranium in Synroc CSZAJMAN, J; SMART, R. ST. C; MYHRA, S et al.Surface & coatings technology. 1987, Vol 30, Num 4, pp 333-342, issn 0257-8972Article

An optical fibre thin film thickness monitorCARANTO, N. R. Y; KADDU, S. C; SZAJMAN, J et al.Measurement science & technology (Print). 1993, Vol 4, Num 8, pp 865-869, issn 0957-0233Article